ELECTRONICS AND COMMUNICATION ENGINEERING WRITTEN TEST QUESTIONS

1. In a forward biased pn junction diode, the sequence of events that best describes the mechanism of
current flow is
(A) injection, and subsequent diffusion and recombination of minority carriers
(B) extraction, and subsequent drift and recombination of minority carriers
(C) extraction, and subsequent diffusion and generation of minority carriers
(D) injection, and subsequent drift and generation of minority carriers

2.  A DC voltage source is connected across a series R-L-C circuit. Under steady-state conditions, the applied DC voltage drops entirely across the
(a) R only 
(b) L only
(c) Y 
(d) R and L combination


3.In an R – L –C circuit, the phase of the current with respect to the circuit voltage will
be 
(A) Lagging. 
(B) Same.
(C)  Leading. 
(D) Depends upon the value of Land C. 

4.In IC technology, dry oxidation (using dry oxygen) as compared to wet oxidation (using steam or
water vapor) produces
(A) superior quality oxide with a higher growth rate
(B) inferior quality oxide with a lower growth rate
(C) inferior quality oxide with a higher growth rate
(D) superior quality oxide with a lower growth rate 
5. In IC technology, dry oxidation (using dry oxygen) as compared to wet oxidation (using steam or
water vapor) produces
(A) superior quality oxide with a higher growth rate
(B superior quality oxide with a lower growth rate
(C) inferior quality oxide with a lower growth rate
(D) inferior quality oxide with a higher growth rate

6. In a MOSFET operating in the saturation region, the channel length modulation effect causes
(A) a decrease in the output resistance 
(B) a decrease in the transconductance
(C) a decrease in the unity-gain cutoff frequency
(D) an increase in the gate-source capacitance

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